Please use this identifier to cite or link to this item: http://hdl.handle.net/1880/25965
Title: A global test generation system for sequential circuits
Authors: Du, Bin
Issue Date: 1998
Publisher: University of Calgary
Description: Bibliography: p. 136-142
UARC
URI: http://hdl.handle.net/1880/25965
ISBN: 0612346706
Appears in Collections:University of Calgary Theses

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