Please use this identifier to cite or link to this item: http://hdl.handle.net/1880/30573
Title: A novel test generation system for sequential circuits
Authors: Du, Bin
Issue Date: 1994
Publisher: Electrical and Computer Engineering, University of Calgary
Description: Bibliography: p. 100-103.
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URI: http://hdl.handle.net/1880/30573
ISBN: 0315993448
Appears in Collections:University of Calgary Theses

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