Please use this identifier to cite or link to this item: http://hdl.handle.net/1880/40087
Title: The effect of amount of software reuse on defect severity in real-time C-base environment
Authors: Ouyang, Sheng
Issue Date: 2000
Publisher: University of Calgary
Description: Bibliography: p. 84-87.
URI: http://hdl.handle.net/1880/40087
ISBN: 0612552667
Appears in Collections:University of Calgary Theses

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