Impedance Characterization of Anodic Barrier Al Oxide Film Beneath Porous Oxide Layer

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dc.contributor.authorBirss, Viola I.en
dc.contributor.authorPotucek, Rudolfen
dc.contributor.authorRateick, Richarden
dc.date.accessioned2007-07-30T16:23:48Z
dc.date.available2007-07-30T16:23:48Z
dc.date.issued2006
dc.description“© The Electrochemical Society, Inc. 2006. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Journal of the Electrochemical Society, 2006, Vol. 153, No. 8: B304-B310.”en
dc.description.refereedYesen
dc.identifier.citationPotucek, R., Rateick, R. and Birss, V. (2006) "Impedance characterization of anodic barrier Al oxide film beneath porous oxide layer". Journal of Electrochemical Society, 153(8): B304-B310.en
dc.identifier.doihttp://dx.doi.org/10.11575/PRISM/35207
dc.identifier.issn0031-4651
dc.identifier.urihttp://hdl.handle.net/1880/44721
dc.language.isoengen
dc.publisherElectrochemical Societyen
dc.publisher.corporateUniversity of Calgaryen
dc.publisher.facultyScienceen
dc.publisher.urlhttp://ecsdl.org/JES/en
dc.subjectChemistryen
dc.subjectAnalytical chemistryen
dc.titleImpedance Characterization of Anodic Barrier Al Oxide Film Beneath Porous Oxide Layeren
dc.typejournal article
thesis.degree.disciplineChemistryen
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