A global test generation system for sequential circuits

Files
34670Du.pdf(4.98 MB)
Date
1998
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Bibliography: p. 136-142
Keywords
Citation
Du, B. (1998). A global test generation system for sequential circuits (Doctoral thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/24552
URI
http://hdl.handle.net/1880/25965
Collections
Legacy Theses