A new approach for modular test generation
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Embargoed until: 2999-01-01
Accessioned
2005-07-29T22:09:10ZAvailable
2005-07-29T22:09:10ZIssued
1995Lcc
TK 7874.75 Y68 1995Lcsh
Integrated circuits - Very large scale integration - Design and constructionSignal processing - Digital techniques
Computer algorithms
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