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dc.contributor.authorBirss, Viola I.en
dc.contributor.authorTilak, B. V.en
dc.contributor.authorWang, J.en
dc.contributor.authorChen, C.-P.en
dc.contributor.authorRangarajan, S. K.en
dc.date.accessioned2007-07-30T20:09:07Z
dc.date.available2007-07-30T20:09:07Z
dc.date.issued2001
dc.identifier.citationTilak, B. V., Birss, V. I., Wang, J., Chen, C.-P. and Rangarajan, S. K. (2001). "Deactivation of Thermally Formed Ru/Ti Oxide Electrodes. An AC Impedance Characterization Study". Journal of the Electrochemical Society, Vol. 148(9): D112-D120.en
dc.identifier.issn0013-4651
dc.identifier.urihttp://hdl.handle.net/1880/44731
dc.description“© The Electrochemical Society, Inc. 2001. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Journal of the Electrochemical Society, 2001, Vol. 148(9).”en
dc.language.isoengen
dc.publisherThe Electrochemical Societyen
dc.subjectChemistryen
dc.subjectAnalytical chemistryen
dc.titleDeactivation of Thermally Formed Ru/Ti Oxide Electrodes. An AC Impedance Characterization Studyen
dc.typejournal article
dc.description.refereedYesen
dc.publisher.urlhttp://www.ecsdl.org/JES/en
dc.publisher.corporateUniversity of Calgaryen
dc.publisher.facultyScienceen
dc.identifier.doihttp://dx.doi.org/10.11575/PRISM/35187
thesis.degree.disciplineChemistryen


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