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dc.contributor.authorBirss, Viola I.en
dc.contributor.authorMyers, R.en
dc.contributor.authorAngerstein-Kozlowska, H.en
dc.contributor.authorConway, B. E.en
dc.date.accessioned2007-07-31T19:41:20Z
dc.date.available2007-07-31T19:41:20Z
dc.date.issued1984
dc.identifier.citationBirss, V., Myers, R., Angerstein-Kozlowska, H. and Conway, B. E. (1984). "Electron Microscopy Study of Formation of Thick Oxide Films on Ir and Ru Electrodes". Journal of the Electrochemical Society, Vol. 131(7): 1502-1510.en
dc.identifier.issn0013-4651
dc.identifier.urihttp://hdl.handle.net/1880/44754
dc.description“© The Electrochemical Society, Inc. 1984. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Journal of the Electrochemical Society, 1984, Vol. 131(7).”en
dc.language.isoengen
dc.publisherThe Electrochemical Societyen
dc.subjectChemistryen
dc.subjectAnalytical chemistryen
dc.titleElectron Microscopy Study of Formation of Thick Oxide Films on Ir and Ru Electrodesen
dc.typejournal article
dc.description.refereedYesen
dc.publisher.urlhttp://ecsdl.org/JES/en
dc.publisher.corporateUniversity of Calgaryen
dc.publisher.facultyScienceen
dc.identifier.doihttp://dx.doi.org/10.11575/PRISM/35198
thesis.degree.disciplineChemistryen


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