Please use this identifier to cite or link to this item:
Title: An integrated model of attitude and affect: Theoretical foundation and an empirical investigation
Authors: Agarwal, James
Malhotra, Naresh K.
Keywords: Attitude;Affect
Issue Date: 2005
Publisher: Elsevier
Citation: Agarwal, James and Naresh K. Malhotra (2005), "An Integrated Model of Attitude and Affect: Theoretical Foundation and Empirical Invesitigation, " Journal of Business Research, Volume 58, Issue 4, April, pp.483-493.
Abstract: The affect (feelings and emotions) and attitude (evaluative judgment based on brand beliefs) streams of research are combined to propose an integrated model of attitude and choice. The essence of the proposed model is based on the interaction effect between affect and cognition. The predictive validity of the proposed model is tested and compared to several other nested models using a regression and logit framework. Results indicate that the proposed model is significantly better than the traditional multiattribute model both in terms of percentage correctly classified and predictive validity. The proposed interaction model is also tested using structural equations modeling with gratifying results. Building on the Kenny and Judd [Psychol. Bull. 96 (1984) 201] approach, the interaction term is estimated using both the Ping [J. Acad. Mark. Sci. 22 (4) (1994) 364; J. Mark. Res. 32 (3) (1995) 336] method and Joreskog and Yang [Nonlinear structural equation models: the Kenny–Judd model with interaction effects. In: Marcoulides GA, Schumacker RE, editors. Advanced Structural Equation Modeling: Issues and Techniques, Mahwah, NJ: Erlbaum, 1996] method. Important findings and implications are discussed together with directions for future research.
Description: This publication is a post print as per the publisher's instructions 11/17/2014
ISSN: 0148-2963
Appears in Collections:Agarwal, James

Files in This Item:
File Description SizeFormat 
Agarwal_An integrated model of attitude and affect_2005-postprint.pdf325.65 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.