Characterization of Oxide Films Formed on Mg-Based WE43 Alloy Using AC/DC Anodization in Silicate Solutions

Birss, V.Xia, S.Yue, R.Rateick, Jr. Richard G.2007-07-302007-07-302004Birss, V., Xia, S., Yue, R. and Rateick Jr., Richard G. (2004). "Characterization of Oxide Films Formed on Mg-Based WE43 Alloy Using AC/DC Anodization in Silicate Solutions". Journal of the Electrochemical Society, Vol. 151(1): B1-B10.0013-4651http://hdl.handle.net/1880/44728“© The Electrochemical Society, Inc. 2004. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Journal of the Electrochemical Society, 2004: Vol. 151(1).”engChemistryAnalytical chemistryCharacterization of Oxide Films Formed on Mg-Based WE43 Alloy Using AC/DC Anodization in Silicate Solutionsjournal articlehttp://dx.doi.org/10.11575/PRISM/35179