Trofimenkoff, Frederick N.Haslett, James William2005-07-192005-07-191970Haslett, J. W. (1970). Noise in metal-oxide-semiconductor field-effect transistors (Doctoral thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/1375782481565http://hdl.handle.net/1880/13753Bibliography: 159-170.xxviii, 215 leaves : ill. ; 30 cm.engUniversity of Calgary graduate students retain copyright ownership and moral rights for their thesis. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.TK 7867.5 H36 1970 MicrofilmElectronic noiseTransistorsField effect transistorsSemi-conductorsdoctoral thesis10.11575/PRISM/13757TK 7867.5 H36 1970 Microfilm