Kim, SeonghwanHoorzad, Hamid2017-05-012017-05-0120172017Hoorzad, H. (2017). Characterization of Viscoelastic Materials Using Atomic Force Microscopy (Master's thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/25296http://hdl.handle.net/11023/3768Atomic Force Microscopy (AFM) is a versatile method for nanoscale measurement of the properties of materials. While many methods have been developed to utilize AFM for nanoscale characterization of stiffness, damping characterization has remained less explored. In this research, we present a method for measuring stiffness and damping using Contact Resonance Atomic Force Microscopy (CR-AFM) and Modal Finite Element Analysis (FEA). To do so we compare resonance peaks and quality factors obtained from FEA and CR-AFM and we adjust the parameters until there are in good agreement. We use this method to measure the stiffness and damping of several polymers.engUniversity of Calgary graduate students retain copyright ownership and moral rights for their thesis. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.Chemistry--PolymerMaterials ScienceEngineering--MechanicalAtomic Force MicroscopyContact Resonance AFMViscoelasticityModal Finite Element AnalysisNanocompositemaster thesis10.11575/PRISM/25296