Johnston, Ronald H.Bancroft, John Campbell2005-07-192005-07-191973Bancroft, J. C. (1973). HIgh frequency measurements by Fourier analysis of time domain reflectometry data (Master's thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/1092682480855http://hdl.handle.net/1880/15562Bibliography: p. 87-88.xvi, 105 leaves : ill. ; 30 cm.engUniversity of Calgary graduate students retain copyright ownership and moral rights for their thesis. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.TK 7878 B35 1973 MicrofilmElectronic measurementsFrequencies of oscillating systemsFourier transformationsmaster thesis10.11575/PRISM/10926TK 7878 B35 1973 Microfilm