Characterization of Viscoelastic Materials Using Atomic Force Microscopy
Abstract
Atomic Force Microscopy (AFM) is a versatile method for nanoscale measurement of the properties of materials. While many methods have been developed to utilize AFM for nanoscale characterization of stiffness, damping characterization has remained less explored. In this research, we present a method for measuring stiffness and damping using Contact Resonance Atomic Force Microscopy (CR-AFM) and Modal Finite Element Analysis (FEA). To do so we compare resonance peaks and quality factors obtained from FEA and CR-AFM and we adjust the parameters until there are in good agreement. We use this method to measure the stiffness and damping of several polymers.
Description
Keywords
Chemistry--Polymer, Materials Science, Engineering--Mechanical
Citation
Hoorzad, H. (2017). Characterization of Viscoelastic Materials Using Atomic Force Microscopy (Master's thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/25296