A new approach for modular test generation

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dc.contributor.advisorGu, Jun
dc.contributor.authorYousif, Abdel-Fattah
dc.date.accessioned2005-07-29T22:09:10Z
dc.date.available2005-07-29T22:09:10Z
dc.date.issued1995
dc.descriptionBibliography: p. 167-172.en
dc.format.extentxv, 172 leaves : ill ; 30 cm.en
dc.identifier.citationYousif, A. (1995). A new approach for modular test generation (Doctoral thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/19428en_US
dc.identifier.doihttp://dx.doi.org/10.11575/PRISM/19428
dc.identifier.isbn0612042065en
dc.identifier.lccTK 7874.75 Y68 1995en
dc.identifier.urihttp://hdl.handle.net/1880/29774
dc.language.isoeng
dc.publisher.institutionUniversity of Calgaryen
dc.publisher.placeCalgaryen
dc.rightsUniversity of Calgary graduate students retain copyright ownership and moral rights for their thesis. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.
dc.subject.lccTK 7874.75 Y68 1995en
dc.subject.lcshIntegrated circuits - Very large scale integration - Design and construction
dc.subject.lcshSignal processing - Digital techniques
dc.subject.lcshComputer algorithms
dc.titleA new approach for modular test generation
dc.typedoctoral thesis
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorUniversity of Calgary
thesis.degree.nameDoctor of Philosophy (PhD)
ucalgary.thesis.accessionTheses Collection 58.002:Box 1011 520538321
ucalgary.thesis.notesoffsiteen
ucalgary.thesis.uarcreleaseyen
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