A novel test generation system for sequential circuits

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dc.contributor.advisorGu, Jun
dc.contributor.authorDu, Bin
dc.date.accessioned2005-07-29T23:14:16Z
dc.date.available2005-07-29T23:14:16Z
dc.date.issued1994
dc.descriptionBibliography: p. 100-103.en
dc.format.extentxi, 103 leaves ; 30 cm.en
dc.identifier.citationDu, B. (1994). A novel test generation system for sequential circuits (Master's thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/20601en_US
dc.identifier.doihttp://dx.doi.org/10.11575/PRISM/20601
dc.identifier.isbn0315993448en
dc.identifier.lccTK 7868 L6 D83 1994en
dc.identifier.urihttp://hdl.handle.net/1880/30573
dc.language.isoeng
dc.publisher.institutionUniversity of Calgaryen
dc.publisher.placeCalgaryen
dc.rightsUniversity of Calgary graduate students retain copyright ownership and moral rights for their thesis. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.
dc.subject.lccTK 7868 L6 D83 1994en
dc.subject.lcshLogic circuits - Testing
dc.subject.lcshIntegrated circuits - Very large scale integration - Design and construction - Data processing
dc.subject.lcshComputer algorithms
dc.titleA novel test generation system for sequential circuits
dc.typemaster thesis
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorUniversity of Calgary
thesis.degree.nameMaster of Science (MSc)
ucalgary.thesis.accessionTheses Collection 58.002:Box 916 520542008
ucalgary.thesis.notesoffsiteen
ucalgary.thesis.uarcreleaseyen
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